Enhanced Secondary-Electron Detection of Single-Ion Implants in Silicon through Thin SiO2 Layers,EB Schneider, OG Lloyd-Willard, K Stockbridge, M Ludlow, S Eserin, L Antwis, DC Cox, RP Webb, BN Murdin, SK Clowes; Nano Letters, 26(2), 795-800, (2026) DOI: 10.1021/acs.nanolett.5c05280
Quantifying the Full Damage Profile of Focused Ion Beams via 4D-STEM Precession Electron Diffraction and PSNR Metrics, MG Mateghin, ZP Aslam, AP Brown, MJ Whiting, SK Clowes, RP Webb, DC Cox, Small Methods, e02258, (2026) DOI: 10.1002/smtd.202502258
