Tag: IBA
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Cultural Heritage
We can use Ion Beam Analysis – PIXE – to look at the trace elements in Cultural Heritage Materials to provide insight in to provenance and origins of the materials. We show an example of a ‘Leonardoesque’ painting.
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Metals in Proteins
MicroPIXE can be used to correctly identify the metal atoms in metaloproteins. X-ray crystallography is very good at identifying the important structure of the protein, but it can be difficult to distinguish the metal in the protein if one exists. A recent random sample of 36 protein samples found that 50% of them had been…
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Gun Shot Residue
Gunshot residue (GSR) is conventionally studied by SEM-EDS. We use Ion Beam Analysis – PIXE – to look for GSR signatures in cases where SEM-EDS is unable to detect all the required three elemental components used to distinguish GSR from other environmental particulates.
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Multilayers
Semiconducting amorphous iron disilicide (a-FeSi2) can be made by ion beam mixing a multilayer stack of pure Fe and Si layers. We show how Rutherford Backscattering Spectroscopy can be used to determine the resulting depth profile of the elements in the modified material system.
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Ion beam analysis and the DataFurnace
Ion beam analysis is an enabling technology for thin film scientists and engineers. It is a powerful group of analytical techniques (known as “Total-IBA“) for determining the elemental composition of thin films. We can get accurate (and traceable) analyses, with good spacial resolution both laterally and in depth. Overview Ion beam analysis (IBA) involves the…
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The MEIS Facility at Huddersfield University
The Medium Energy Ion Scattering Facility at Huddersfield University is described and some examples are provided.