Category: Resources
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CrystalDraw
CrystalDraw has been written to produce models of crystal structures and their associated axial and planar channelling directions in three-dimensions and to generate their corresponding two-dimensional projections. Visualisation of the models using specially written macros within Paraview illustrates how to orient and manipulate crystals for channelling measurements and guide interpretations of collected channelling data. Crystal…
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Ion beam analysis and the DataFurnace
Ion beam analysis is an enabling technology for thin film scientists and engineers. It is a powerful group of analytical techniques (known as “Total-IBA“) for determining the elemental composition of thin films. We can get accurate (and traceable) analyses, with good spacial resolution both laterally and in depth. Overview Ion beam analysis (IBA) involves the…
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SUSPRE
SUSPRE (Surrey University Sputter Profile From Energy Deposition) was originally commissioned by VG Ionex in the late 1980s to help interpret dynamic SIMS spectra. It is based around the Projected Range Algorithm – formulated by Jochen Biersack – as a solution to the Boltzmann Transport Equation. It has been demonstrated to be as accurate as…